The Roughness-Enhanced Light Emission from Metal-Oxide-Silicon Light-Emitting Diodes Using Very High Vacuum Prebake
نویسندگان
چکیده
The Roughness-Enhanced Light Emission from Metal-Oxide-Silicon Light-Emitting Diodes Using Very High Vacuum Prebake Min-Hung LEE, Kuan-Fu CHEN, Chang-Chi LAI, Chee Wee LIU∗, Woei-Wu PAI1, Miin-Jang CHEN2 and Ching-Fuh LIN2 Department of Electrical Engineering and Graduate Institute of Electronics Engineering, National Taiwan University, Taipei, Taiwan, R.O.C. 1Center for Condensed Matter Sciences, National Taiwan University, Taipei, Taiwan, R.O.C. 2Department of Electrical Engineering and Graduate Institute of Electro-Optical Engineering, National Taiwan University, Taipei, Taiwan, R.O.C.
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